qualcomm / fastconnect_6700_firmware CVEs

Transient DOS in Multi-Mode Call Processor while processing UE policy container.

Transient DOS in Multi-Mode Call Processor due to UE failure because of heap leakage.

Memory corruption while invoking IOCTLs calls from user space for internal mem MAP and internal mem UNMAP.

Memory corruption in Audio when memory map command is executed consecutively in ADSP.

Memory corruption while processing Listen Sound Model client payload buffer when there is a request for Listen Sound session get parameter from ST HAL.

Memory corruption when HLOS allocates the response payload buffer to copy the data received from ADSP in response to AVCS_LOAD_MODULE command.

Memory corruption while running NPU, when NETWORK_UNLOAD and (NETWORK_UNLOAD or NETWORK_EXECUTE_V2) commands are submitted at the same time.

Memory corruption when resource manager sends the host kernel a reply message with multiple fragments.

Transient DOS when WLAN firmware receives "reassoc response" frame including RIC_DATA element.

Transient DOS while processing a WMI P2P listen start command (0xD00A) sent from host.

Memory corruption while running VK synchronization with KASAN enabled.

Memory corruption in wearables while processing data from AON.

Transient DOS in WLAN Firmware while parsing a BTM request.

Transient DOS in Data Modem during DTLS handshake.

Memory corruption while receiving a message in Bus Socket Transport Server.

Cryptographic issue in Automotive while unwrapping the key secs2d and verifying with RPMB data.

Memory corruption in Data Modem when a non-standard SDP body, during a VOLTE call.

Information disclosure in Core services while processing a Diag command.

Memory corruption in Graphics Linux while assigning shared virtual memory region during IOCTL call.

Memory corruption while submitting a large list of sync points in an AUX command to the IOCTL_KGSL_GPU_AUX_COMMAND.

Transient DOS while parsing WPA IES, when it is passed with length more than expected size.

Memory corruption while processing pin reply in Bluetooth, when pin code received from APP layer is greater than expected size.

Transient DOS when processing a NULL buffer while parsing WLAN vdev.

Memory corruption when processing cmd parameters while parsing vdev.

Transient DOS in Bluetooth Host while rfc slot allocation.