CVE-2024-53017
Published Jun 3, 2025Memory corruption while handling test pattern generator IOCTL command.
Vendor/product archive
23 CVEs tagged to qualcomm / wcn3620 — 0 Critical, 16 High, 7 Medium, 0 Low, 0 Unrated.
Memory corruption while handling test pattern generator IOCTL command.
Memory corruption while processing an IOCTL call to set mixer controls.
Memory corruption can occur during context user dumps due to inadequate checks on buffer length.
Memory corruption may occur when invoking IOCTL calls from userspace to the camera kernel driver to dump request information, due to a missing memory requirement check.
Memory corruption while acquire and update IOCTLs during IFE output resource ID validation.
Memory corruption while invoking IOCTL calls from userspace to camera kernel driver to dump request information.
Memory corruption Camera kernel when large number of devices are attached through userspace.
Memory corruption during array access in Camera kernel due to invalid index from invalid command data.
Memory corruption due to improper bounds check while command handling in camera-kernel driver.
Memory corruption while encoding JPEG format.
Memory corruption when blob structure is modified by user-space after kernel verification.
Memory corruption while handling schedule request in Camera Request Manager(CRM) due to invalid link count in the corresponding session.
Information disclosure may occur during a video call if a device resets due to a non-conforming RTCP packet that doesn`t adhere to RFC standards.
Memory corruption caused by missing locks and checks on the DMA fence and improper synchronization.
Memory corruption while invoking IOCTL calls from the use-space for HGSL memory node.
Memory corruption while processing camera use case IOCTL call.
Memory corruption while IOCLT is called when device is in invalid state and the WMI command buffer may be freed twice.
Memory corruption while station LL statistic handling.
Memory corruption while handling IOCTL calls in JPEG Encoder driver.
Memory corruption while processing the update SIM PB records request.
memory corruption when WiFi display APIs are invoked with large random inputs.
Memory corruption in SPI buses due to improper input validation while reading address configuration from spi buses in Snapdragon Mobile, Snapdragon Wearables
Memory corruption in i2c buses due to improper input validation while reading address configuration from i2c driver in Snapdragon Mobile, Snapdragon Wearables