CVE-2025-21449
Published Jul 8, 2025Transient DOS may occur while processing malformed length field in SSID IEs.
- evidence mentions
- 1
- Buzz score
- 11.9
Vendor/product archive
2 CVEs tagged to qualcomm / snapdragon_4_gen_1_mobile_firmware — 0 Critical, 2 High, 0 Medium, 0 Low, 0 Unrated.
Transient DOS may occur while processing malformed length field in SSID IEs.
Information disclosure while decoding this RTP packet Payload when UE receives the RTP packet from the network.